Material Surface Analytics Unit
The Materials Surface Analytics Unit supports you in the comprehensive chemical, structural, and physical characterization of materials and surfaces. Using techniques such as XRD, SAXS, and WAXS, we analyze crystalline and nanostructured materials, while XPS provides detailed information on the chemical composition and chemical state of surfaces. Contact angle measurements are used to investigate wettability and surface properties. In addition, Raman spectroscopy, AFM, and ellipsometry are available for the analysis of molecular structures, surface topography, and thin films. We also provide consultation on the selection of suitable analytical methods, the development of measurement strategies, and the evaluation and interpretation of the resulting data.
We offer:
- X-ray Diffraction (XRD)
- Small-Angle X-ray Scattering (SAXS)
- Wide-Angle X-ray Scattering (WAXS)
- X-ray Photoelectron Spectroscopy (XPS)
- Contact Angle Measurements
- Raman Spectroscopy
- Atomic Force Microscopy (AFM)
- Ellipsometry
- Structural Characterization
- Surface Chemical Analysis
- Surface Topography Analysis
- Thin-Film Characterization
- Wettability and Surface Energy Analysis
- Method Development
- Data Evaluation and Interpretation
- Consultation Services